Measurement Techniques for Radio Frequency Nanoelectronics (The Cambridge RF and Microwave Engineering Series)
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- Synopsis
- Connect basic theory with real-world applications with this practical, cross-disciplinary guide to radio frequency measurement of nanoscale devices and materials. • Learn the techniques needed for characterizing the performance of devices and their constituent building blocks, including semiconducting nanowires, graphene, and other two dimensional materials such as transition metal dichalcogenides • Gain practical insights into instrumentation, including on-wafer measurement platforms and scanning microwave microscopy • Discover how measurement techniques can be applied to solve real-world problems, in areas such as passive and active nanoelectronic devices, semiconductor dopant profiling, subsurface nanoscale tomography, nanoscale magnetic device engineering, and broadband, spatially localized measurements of biological materials Featuring numerous practical examples, and written in a concise yet rigorous style, this is the ideal resource for researchers, practicing engineers, and graduate students new to the field of radio frequency nanoelectronics. The first book on radio frequency and microwave nanoelectronics. Promotes the use of quantitative measurements through accurate modelling, numerical verification, reliable calibration, and determination of measurement uncertainties. Provides numerous practical examples linking the theory with current applications.
- Copyright:
- 2017
Book Details
- Book Quality:
- Publisher Quality
- Book Size:
- 328 Pages
- ISBN-13:
- 9781108325912
- Related ISBNs:
- 9781107120686, 9781107120686
- Publisher:
- Cambridge University Press
- Date of Addition:
- 06/15/18
- Copyrighted By:
- Cambridge University Press
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Science
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.