Secondary Ion Mass Spectrometry
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- Synopsis
- Serves as a practical reference for those involved in Secondary Ion Mass Spectrometry (SIMS) * Introduces SIMS along with the highly diverse fields (Chemistry, Physics, Geology and Biology) to it is applied using up to date illustrations * Introduces the accepted fundamentals and pertinent models associated with elemental and molecular sputtering and ion emission * Covers the theory and modes of operation of the instrumentation used in the various forms of SIMS (Static vs Dynamic vs Cluster ion SIMS) * Details how data collection/processing can be carried out, with an emphasis placed on how to recognize and avoid commonly occurring analysis induced distortions * Presented as concisely as believed possible with All sections prepared such that they can be read independently of each other
- Copyright:
- 2014
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9781118916773
- Related ISBNs:
- 9781118480489, 9781118916780
- Publisher:
- Wiley
- Date of Addition:
- 04/27/15
- Copyrighted By:
- Wiley
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Science
- Submitted By:
- N/A
- Usage Restrictions:
- This is a copyrighted book.