Sample Preparation Handbook for Transmission Electron Microscopy: Methodology

By: and and and and

Sign Up Now! Already a Member? Log In
You must be logged into Bookshare to access this title. Learn about membership options, or view our freely available titles.

Synopsis
This two-volume Handbook is a comprehensive and authoritative guide to sample preparation for the transmission electron microscope. This first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology. The remainder of the book is dedicated to technical hints, including 22 detailed protocols for preparing thin slices for TEM analysis. Experimental conditions and guidelines, options and variations, advantages and constraints, common artefacts, and theoretical issues are considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. Finally, a practical, authoritative, and interdisciplinary handbook is available to guide you through all of the most current techniques for successful sample preparation in all fields from materials science to biology.
Copyright:
1977

Book Details

Book Quality:
Publisher Quality
ISBN-13:
9780387981826
Related ISBNs:
9780387981819
Publisher:
Springer New York
Date of Addition:
Copyrighted By:
Jeanne Ayache, Danièle Laub, Jacqueline Boumendil, Gabrielle Ehret, Luc Beaunier
Adult content:
No
Language:
English
Has Image Descriptions:
No
Categories:
Nonfiction, Science, Technology, Earth Sciences
Submitted By:
Bookshare Staff
Usage Restrictions:
This is a copyrighted book.

Reviews

No Rating Yet