Optical Imaging and Metrology: Advanced Technologies
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- Synopsis
- A comprehensive review of the state of the art and advances in the field, while also outlining the future potential and development trends of optical imaging and optical metrology, an area of fast growth with numerous applications in nanotechnology and nanophysics. Written by the world's leading experts in the field, it fills the gap in the current literature by bridging the fields of optical imaging and metrology, and is the only up-to-date resource in terms of fundamental knowledge, basic concepts, methodologies, applications, and development trends.
- Copyright:
- 2007
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9783527648467
- Related ISBNs:
- 9783527648443, 9783527410644
- Publisher:
- Wiley
- Date of Addition:
- 04/22/20
- Copyrighted By:
- John Wiley & Sons
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Science
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.
- Edited by:
- Wolfgang Osten
- Edited by:
- Nadya Reingand