Particles on Surfaces: Detection: Adhesion, and Removal
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- Synopsis
- This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics, on spacecraft, and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the cleanroom; abrasive blasting media for contamination-free deburring processes; and more.;The book is intended for physical, chemical, surface and colloid chemists, materials scientists; polymers, plastics, electrical and electronics, computer, chemical and mechanical engineers; and upper-level undergraduate and graduate students in these disciplines.
- Copyright:
- 1994
Book Details
- Book Quality:
- Publisher Quality
- Book Size:
- 440 Pages
- ISBN-13:
- 9781000148473
- Related ISBNs:
- 9780824795351, 9781003067429
- Publisher:
- CRC Press
- Date of Addition:
- 08/26/20
- Copyrighted By:
- Taylor
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Science, Technology
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.
- Edited by:
- K.L. Mittal