High Resolution X-Ray Diffractometry And Topography
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- Synopsis
- The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization
- Copyright:
- 1998
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9781135478605
- Related ISBNs:
- 9780850667585, 9780367400637, 9781135478568, 9780203979198, 9780429224836
- Publisher:
- CRC Press
- Date of Addition:
- 12/08/24
- Copyrighted By:
- D. Keith Bowen and Brian K. Tanner
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Technology
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.