Extreme Statistics in Nanoscale Memory Design
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- Synopsis
- This book explains the problem of estimating statistics of memory performance variation induced due to IC manufacturing process variations, and provides solutions recently proposed in the Electronic Design Automation (EDA) community. The material serves as a comprehensive reference for researchers and practitioners interested in the problem of estimating extreme statistics for memories.
- Copyright:
- 2010
Book Details
- Book Quality:
- Publisher Quality
- ISBN-13:
- 9781441966063
- Related ISBNs:
- 9781441966056
- Publisher:
- Springer US
- Date of Addition:
- 05/12/13
- Copyrighted By:
- Springer US, Boston, MA
- Adult content:
- No
- Language:
- English
- Has Image Descriptions:
- No
- Categories:
- Nonfiction, Technology
- Submitted By:
- Bookshare Staff
- Usage Restrictions:
- This is a copyrighted book.