CMOS Plasma and Process Damage

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Synopsis
This book discusses the complex technology of building CMOS computer chips and covers some of the unusual problems that can occur during chip manufacturing. Readers will learn how plasma and process damage results from the high-energy processes that are used in chip manufacturing, causing harm to the chips, functional failure and reliability problems.
Copyright:
2025

Book Details

Book Quality:
Publisher Quality
ISBN-13:
9783031890291
Related ISBNs:
9783031890284
Publisher:
Springer Nature Switzerland
Date of Addition:
Copyrighted By:
The Editor
Adult content:
No
Language:
English
Has Image Descriptions:
No
Categories:
Nonfiction, Science, Computers and Internet, Technology
Submitted By:
Bookshare Staff
Usage Restrictions:
This is a copyrighted book.

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